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Jaivardhan Sinha

IK Indian Institute Of Technology Kanpur: 1 patents #5 of 18Top 30%
Overall (2017): #384,591 of 506,227Top 80%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9778202 Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample Satyajit Banerjee, Shyam Mohan 2017-10-03