Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9784762 | Determination of local contact potential difference by noncontact atomic force microscopy | Leo Gross, Gerhard Meyer, Bruno Schuler | 2017-10-10 |
WS
Wolfram Steurer
Overall (2017): #195,770 of 506,227Top 40%
1
Patents 2017