Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9784762 | Determination of local contact potential difference by noncontact atomic force microscopy | Leo Gross, Bruno Schuler, Wolfram Steurer | 2017-10-10 |
GM
Gerhard Meyer
Overall (2017): #416,969 of 506,227Top 85%
1
Patents 2017