Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9703689 | Defect detection using test cases generated from test models | Natsumi Kurashima, Hirofumi Matsuzawa, Rei Suginaka, Masaru Yamamoto | 2017-07-11 |
TA
Tomio Amano
Overall (2017): #214,603 of 506,227Top 45%
1
Patents 2017