MY

Masaru Yamamoto

IBM: 1 patents #5,570 of 10,852Top 55%
Overall (2017): #313,342 of 506,227Top 65%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9703689 Defect detection using test cases generated from test models Tomio Amano, Natsumi Kurashima, Hirofumi Matsuzawa, Rei Suginaka 2017-07-11