Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9651451 | Backlash measurement device and backlash measurement method | Kazunari Inamori, Hideo Suzuki, Susumu Tanaka, Seiichiro Naka | 2017-05-16 |
YS
Yuji Sezaki
Overall (2017): #181,097 of 506,227Top 40%
1
Patents 2017