Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9651451 | Backlash measurement device and backlash measurement method | Hideo Suzuki, Susumu Tanaka, Seiichiro Naka, Yuji Sezaki | 2017-05-16 |
KI
Kazunari Inamori
Overall (2017): #355,356 of 506,227Top 75%
1
Patents 2017