Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824853 | Electron microscope device and imaging method using same | Mitsutoshi KOBAYASHI, Maki Tanaka | 2017-11-21 |
| 9741530 | Charged-particle-beam device, specimen-image acquisition method, and program recording medium | Yusuke Ominami, Maki Tanaka, Shinsuke Kawanishi | 2017-08-22 |