Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804107 | Pattern measurement device and computer program for evaluating patterns based on centroids of the patterns | Miki Isawa, Satoru Yamaguchi, Motonobu Hommi | 2017-10-31 |
| 9704235 | Semiconductor inspection system | Yuichi Abe | 2017-07-11 |