MT

Manfred Gawein Tenner

AB Asml Netherlands B.V.: 1 patents #199 of 568Top 40%
Overall (2017): #315,045 of 506,227Top 65%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9753377 Deformation pattern recognition method, pattern transferring method, processing device monitoring method, and lithographic apparatus Hakki Ergün Cekli, Irina Lyulina, Richard Johannes Franciscus Van Haren, Stefan Cornelis Theodorus Van Der Sanden 2017-09-05