Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9638643 | Particulate contamination measurement method and apparatus | Antonius Martinus Cornelis Petrus De Jong | 2017-05-02 |
| 9599908 | Lithographic apparatus and contamination removal or prevention method | Anthonius Martinus Cornelis Petrus De Jong, Hans Jansen, Martinus Hendrikus Antonius Leenders, Antonius Johannus Van Der Net, Peter Franciscus Wanten +4 more | 2017-03-21 |
| 9567671 | Method and apparatus for depositing atomic layers on a substrate | Raymond Jacobus Wilhelmus Knaapen, Ruud Olieslagers, Dennis Van Den Berg, Matijs C. van den Boer, Diederik Jan Maas +1 more | 2017-02-14 |