Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ofer Adan, Haim Feldman, Ofer Shneyour, Ron Bar-Or +1 more | 2017-12-05 |
| 9784689 | Method and system for inspecting an object with an array of beams | Ido Almog | 2017-10-10 |