Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ron Naftali, Ofer Adan, Ofer Shneyour, Ron Bar-Or +1 more | 2017-12-05 |
| 9810643 | System and method for defect detection using multi-spot scanning | Amir Shoham, Yoav Berlatzky | 2017-11-07 |
| 9535014 | Systems and methods for inspecting an object | Ido Dolev, Ido Almog | 2017-01-03 |