Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9720033 | On-chip parameter measurement | Jafar Savoj, Brian S. Leibowitz | 2017-08-01 |
| 9595526 | Multi-die fine grain integrated voltage regulation | Jared L. Zerbe, Jun Zhai, Shawn Searles | 2017-03-14 |