Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9406496 | Method and system for improving characteristic peak signals in analytical electron microscopy | Sonia Estrade Albiol, Joaquin Portillo Serra, José Manuel Rebled Corsellas, Lluís Yedra Cardona, Stavros Nicolopoulos +2 more | 2016-08-02 |