Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9406496 | Method and system for improving characteristic peak signals in analytical electron microscopy | Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiró Martinez, José Manuel Rebled Corsellas, Lluís Yedra Cardona +2 more | 2016-08-02 |
| 9274070 | System and process for measuring strain in materials at high spatial resolution | Jon Karl Weiss, Amith D. Darbal, Raman D. Narayan, Steven Kim | 2016-03-01 |