Issued Patents 2016
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9513332 | Probe card partition scheme | Mill-Jer Wang | 2016-12-06 |
| 9514268 | Interposer defect coverage metric and method to maximize the same | Ashok Mehta | 2016-12-06 |
| 9404971 | Circuit and method for monolithic stacked integrated circuit testing | Ashok Mehta | 2016-08-02 |
| 9390219 | System for and method of semiconductor fault detection | Yuan-Han Lee | 2016-07-12 |
| 9391110 | Wafer on wafer stack method of forming and method of using the same | Yun-Han Lee | 2016-07-12 |
| 9341672 | Method and apparatus for interconnect test | Saman M. I. Adham | 2016-05-17 |