Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9514268 | Interposer defect coverage metric and method to maximize the same | Sandeep Kumar Goel | 2016-12-06 |
| 9404971 | Circuit and method for monolithic stacked integrated circuit testing | Sandeep Kumar Goel | 2016-08-02 |