Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417263 | Testing probe head for wafer level testing, and test probe card | Wensen Hung, Po-Shi Yao | 2016-08-16 |
| 9261534 | Shield pin arrangement | Po-Yi Huang | 2016-02-16 |
YK
Yung-Hsin Kuo
Overall (2016): #83,021 of 481,213Top 20%
2
Patents 2016