Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417263 | Testing probe head for wafer level testing, and test probe card | Yung-Hsin Kuo, Wensen Hung | 2016-08-16 |
PY
Po-Shi Yao
Overall (2016): #261,813 of 481,213Top 55%
1
Patents 2016