Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9404743 | Method for validating measurement data | Chui-Jung Chiu, Jen-Chieh Lo, Ru-Gun Liu | 2016-08-02 |
| 9367655 | Topography-aware lithography pattern check | I-Chang Shih, Chung-Min Fu, Yung-Fong Lu, Feng-Yuan Chiu, Chiu Hsiu Chen | 2016-06-14 |