Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523711 | Probe apparatus and wafer mounting table for probe apparatus | Eiji Hayashi, Munetoshi Nagasaka | 2016-12-20 |
| 9383389 | Prober and needle-tip polishing device for probe card | Shuji Akiyama | 2016-07-05 |
| 9261553 | Probe apparatus | Eiichi Shinohara, Munetoshi Nagasaka, Isamu Inomata, Yoshiyasu Kato | 2016-02-16 |