JD

Jurgen Durst

SA Siemens Aktiengesellschaft: 2 patents #210 of 1,769Top 15%
📍 Dittenheim, DE: #1 of 1 inventorsTop 100%
Overall (2016): #127,913 of 481,213Top 30%
2
Patents 2016

Issued Patents 2016

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9498171 Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement Gisela Anton, Florian Bayer, Thilo Michel, Georg Pelzer, Jens Rieger +1 more 2016-11-22
9500602 Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning Gisela Anton, Florian Bayer, Thilo Michel, Georg Pelzer, Jens Rieger +1 more 2016-11-22