Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9498171 | Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement | Gisela Anton, Florian Bayer, Jurgen Durst, Georg Pelzer, Jens Rieger +1 more | 2016-11-22 |
| 9500602 | Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning | Gisela Anton, Florian Bayer, Jurgen Durst, Georg Pelzer, Jens Rieger +1 more | 2016-11-22 |
| 9297912 | Single layer 3D tracking semiconductor detector | Michael T. Campbell, Jan Jakubek | 2016-03-29 |