Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9267903 | Methods and apparatuses for inspecting semiconductor devices using electron beams | Mira Park, Younghoon Sohn, Yusin Yang, Sangkil Lee | 2016-02-23 |
YJ
Yong-Deok Jeong
Overall (2016): #175,309 of 481,213Top 40%
1
Patents 2016