Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9466537 | Method of inspecting semiconductor device and method of fabricating semiconductor device using the same | Minkook KIM, Wooseok Ko, Yusin Yang, Chungsam Jun | 2016-10-11 |
| 9455121 | Semiconductor inspection system and methods of inspecting a semiconductor device using the same | Hyunwoo KIM, Wooseok Ko, Minkook KIM, Jung-Hwan Kim, Yusin Yang +1 more | 2016-09-27 |
| 9267903 | Methods and apparatuses for inspecting semiconductor devices using electron beams | Mira Park, Younghoon Sohn, Yusin Yang, Yong-Deok Jeong | 2016-02-23 |