Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9360662 | Optical measurement system and method for measuring critical dimension of nanostructure | Sergey Nikolaevich Koptyaev, Maxim Vladimirovich Ryabko | 2016-06-07 |
MR
Michael Nikolaevich Rychagov
Overall (2016): #287,247 of 481,213Top 60%
1
Patents 2016