Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9400254 | Method and device for measuring critical dimension of nanostructure | Maxim Vladimirovich Riabko, Alexey Dmitrievich Lantsov | 2016-07-26 |
AS
Alexander Shcherbakov
Overall (2016): #471,480 of 481,213Top 100%
1
Patents 2016