Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470713 | Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit | Bernd Geck | 2016-10-18 |
| 9291644 | Contactless measuring system for contactless decoupling of a signal running on a signal waveguide | — | 2016-03-22 |