Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470713 | Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit | Thomas Zelder | 2016-10-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470713 | Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit | Thomas Zelder | 2016-10-18 |