Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9347895 | X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control program | — | 2016-05-24 |
| D750783 | X-ray residual stress measuring instrument | Suguru Sasaki | 2016-03-01 |