Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D750783 | X-ray residual stress measuring instrument | Shoichi Yasukawa | 2016-03-01 |
| 9263777 | Semiconductor device, battery pack, and electronic device | Youhei Kawahara, Kenta Kobayashi, Yusuke Sugawara | 2016-02-16 |