Issued Patents 2016
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9494641 | Degradation detector and method of detecting the aging of an integrated circuit | Stephen Felix, Tezaswi Raja, Roman Surgutchik | 2016-11-15 |
| 9479001 | Technique for supplying power to a load via voltage control and current control modes of operation | Rene Pierre Marchand, Thomas Dean Skelton, Matthew R. Longnecker | 2016-10-25 |
| 9471315 | Run-time instrumentation reporting | Mark S. Farrell, Charles W. Gainey, Jr., Marcel Mitran, Chung-Lung K. Shum | 2016-10-18 |
| 9459873 | Run-time instrumentation monitoring of processor characteristics | Mark S. Farrell, Charles W. Gainey, Jr., Marcel Mitran, Damian L. Osisek, Chung-Lung K. Shum +1 more | 2016-10-04 |
| 9454462 | Run-time instrumentation monitoring for processor characteristic changes | Mark S. Farrell, Charles W. Gainey, Jr., Marcel Mitran, Damian L. Osisek, Chung-Lung K. Shum +1 more | 2016-09-27 |
| 9423846 | Powered ring to maintain IO state independent of the core of an integrated circuit device | Ewa M. Kubalska | 2016-08-23 |
| 9411390 | Integrated circuit device having power domains and partitions based on use case power optimization | Parthasarathy Sriram, Stephane Le Provost | 2016-08-09 |
| 9395799 | Power management techniques for USB interfaces | Eric Masson, Matthew R. Longnecker, Hemalkumar Chandrkant Doshi | 2016-07-19 |
| 9389622 | Voltage optimization circuit and managing voltage margins of an integrated circuit | Stephen Felix, Jesse Max Guss, Tezaswi Raja | 2016-07-12 |
| 9280448 | Controlling operation of a run-time instrumentation facility from a lesser-privileged state | Mark S. Farrell, Charles W. Gainey, Jr., Marcel Mitran, Chung-Lung K. Shum, Timothy J. Slegel +1 more | 2016-03-08 |
| 9280346 | Run-time instrumentation reporting | Mark S. Farrell, Charles W. Gainey, Jr., Marcel Mitran, Chung-Lung K. Shum | 2016-03-08 |
| 9250902 | Determining the status of run-time-instrumentation controls | Mark S. Farrell, Charles W. Gainey, Jr., Chung-Lung K. Shum | 2016-02-02 |
| 9250903 | Determining the status of run-time-instrumentation controls | Mark S. Farrell, Charles W. Gainey, Jr., Chung-Lung K. Shum | 2016-02-02 |