Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9330975 | Integrated circuit substrates comprising through-substrate vias and methods of forming through-substrate vias | Hongqi Li | 2016-05-03 |
| 9305865 | Devices, systems and methods for manufacturing through-substrate vias and front-side structures | Jian He, Lalapet Rangan Vasudevan, Kyle K. Kirby, Hongqi Li | 2016-04-05 |
| 9297855 | Integrated circuit with increased fault coverage | Huangsheng Ding, Ling Wang | 2016-03-29 |
| 9298572 | Built-in self test (BIST) with clock control | Nisar Ahmed, Nipun Mahajan | 2016-03-29 |
| 9285424 | Method and system for logic built-in self-test | Nitin Singh, Amit Jindal | 2016-03-15 |