XC

Xing Chu

KL Kla-Tencor: 1 patents #124 of 327Top 40%
Overall (2016): #182,671 of 481,213Top 40%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9311698 Detecting defects on a wafer using template image matching Jan Lauber, J. Rex Runyon 2016-04-12