Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9429856 | Detectable overlay targets with strong definition of center locations | Amnon Manassen | 2016-08-30 |
| 9255787 | Measurement of critical dimension and scanner aberration utilizing metrology targets | Amnon Manassen | 2016-02-09 |