Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9519210 | Voltage contrast characterization structures and methods for within chip process variation characterization | Oliver D. Patterson, Yunsheng Song, Zhigang Song | 2016-12-13 |
| 9354252 | Pressure sensing and control for semiconductor wafer probing | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang | 2016-05-31 |