Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9429619 | Reliability test screen optimization | Jeanne P. Bickford, Douglas S. Dewey, Ernest A. Viau, Jr. | 2016-08-30 |
| 9310426 | On-going reliability monitoring of integrated circuit chips in the field | Douglas S. Dewey, Pascal A. Nsame, Anthony D. Polson | 2016-04-12 |