Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9411014 | Reordering or removal of test patterns for detecting faults in integrated circuit | Parthajit Bhattacharya, Rohit Kapur | 2016-08-09 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9411014 | Reordering or removal of test patterns for detecting faults in integrated circuit | Parthajit Bhattacharya, Rohit Kapur | 2016-08-09 |