Issued Patents 2016
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9530514 | Select gate defect detection | Jagdish Sabde, Jayavel Pachamuthu | 2016-12-27 |
| 9514835 | Determination of word line to word line shorts between adjacent blocks | Jagdish Sabde, Khanh Nguyen | 2016-12-06 |
| 9496040 | Adaptive multi-page programming methods and apparatus for non-volatile memory | Rajan Paudel, Jagdish Sabde | 2016-11-15 |
| 9484086 | Determination of word line to local source line shorts | Jagdish Sabde | 2016-11-01 |
| 9460809 | AC stress mode to screen out word line to word line shorts | Jagdish Sabde | 2016-10-04 |
| 9449698 | Block and zone erase algorithm for memory | Rajan Paudel, Jagdish Sabde | 2016-09-20 |
| 9449694 | Non-volatile memory with multi-word line select for defect detection operations | Rajan Paudel, Jagdish Sabde, Khanh Nguyen | 2016-09-20 |
| 9443612 | Determination of bit line to low voltage signal shorts | Jagdish M. Sbade | 2016-09-13 |
| 9269446 | Methods to improve programming of slow cells | Jagdish Sabde, Jayavel Pachamuthu, Ankitkumar Babariya | 2016-02-23 |
| 9240249 | AC stress methods to screen out bit line defects | Jagdish Sabde, Jayavel Pachamuthu | 2016-01-19 |