Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9285417 | Low-voltage IC test for defect screening | Daniel J. Poindexter, Karre M. Greene, Kenneth A. Lavallee, Keith C. Stevens | 2016-03-15 |
JC
James M. Crafts
Overall (2016): #369,319 of 481,213Top 80%
1
Patents 2016