Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372208 | Signal monitoring of through-wafer vias using a multi-layer inductor | Mark A. DiRocco, Kirk D. Peterson, Norman W. Robson | 2016-06-21 |
| 9285417 | Low-voltage IC test for defect screening | Daniel J. Poindexter, James M. Crafts, Karre M. Greene, Kenneth A. Lavallee | 2016-03-15 |