Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9508610 | Inline measurement of molding material thickness using terahertz reflectance | Shuhong Liu, Nilanjan Ghosh, Zhiyong Wang, Shripad Gokhale, Jieping Zhang | 2016-11-29 |
| 9389064 | Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens | Shuhong Liu, Zhiyong Wang, Nilanjan Ghosh | 2016-07-12 |
| 9291576 | Detection of defect in die | Mario Pacheco | 2016-03-22 |