| 9514841 |
Implementing eFuse visual security of stored data using EDRAM |
Todd A. Christensen, Karl R. Erickson, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann |
2016-12-06 |
| 9496045 |
Sensing of non-volatile memory cell having two complementary memory transistors |
Robert E. Kilker, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann |
2016-11-15 |
| 9443767 |
Structure for metal oxide semiconductor capacitor |
Karl R. Erickson, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann |
2016-09-13 |
| 9424948 |
Detection of initial state by eFuse array |
Karl R. Erickson, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann |
2016-08-23 |
| 9405311 |
Bias-temperature induced damage mitigation circuit |
David M. Onsongo, Kirk D. Peterson, John E. Sheets, II |
2016-08-02 |
| 9401643 |
Bias-temperature induced damage mitigation circuit |
David M. Onsongo, Kirk D. Peterson, John E. Sheets, II |
2016-07-26 |
| 9378836 |
Sensing circuit for a non-volatile memory cell having two complementary memory transistors |
Robert E. Kilker, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann |
2016-06-28 |
| 9369308 |
Signal transmission reducing coupling caused delay variation |
David H. Allen, Douglas M. Dewanz, John E. Sheets, II |
2016-06-14 |
| 9343464 |
Implementing eDRAM stacked FET structure |
Karl R. Erickson, John E. Sheets, II, Kelly L. Williams |
2016-05-17 |
| 9312272 |
Implementing buried FET utilizing drain of finFET as gate of buried FET |
Karl R. Erickson, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams |
2016-04-12 |
| 9252100 |
Multiple-patterned semiconductor device channels |
David H. Allen, Douglas M. Dewanz, John E. Sheets, II, Kelly L. Williams |
2016-02-02 |
| 9252083 |
Semiconductor chip with power gating through silicon vias |
Karl R. Erickson, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann, Kelly L. Williams |
2016-02-02 |
| 9245884 |
Structure for metal oxide semiconductor capacitor |
Karl R. Erickson, Phil C. Paone, John E. Sheets, II, Gregory J. Uhlmann |
2016-01-26 |
