Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9529279 | Method and apparatus for inspecting a substrate | Kirk J. Bertsche, Mark A. McCord, Stuart L. Friedman | 2016-12-27 |
| 9291578 | X-ray photoemission microscope for integrated devices | — | 2016-03-22 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9529279 | Method and apparatus for inspecting a substrate | Kirk J. Bertsche, Mark A. McCord, Stuart L. Friedman | 2016-12-27 |
| 9291578 | X-ray photoemission microscope for integrated devices | — | 2016-03-22 |