Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9529279 | Method and apparatus for inspecting a substrate | David L. Adler, Kirk J. Bertsche, Stuart L. Friedman | 2016-12-27 |
| 9366524 | Alignment sensor and height sensor | Joseph A. DiRegolo | 2016-06-14 |
| 9347824 | Light collection optics for measuring flux and spectrum from light-emitting devices | Joseph A. DiRegolo, Michael Robert Gluszczak | 2016-05-24 |