Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9391447 | Interposer to regulate current for wafer test tooling | Evan M. Fledell, Paul B. Fischer, Timothy J. Maloney, Jack D. Pippin | 2016-07-12 |
| 9360502 | Increasing current carrying capability through direct liquid cooling of test contacts | Warren S. Crippen, Brett D. Grossman, Pooya Tadayon | 2016-06-07 |
| 9279830 | Test probe structures and methods including positioning test probe structures in a test head | Warren S. Crippen, Charlotte C. Kwong, David Shia | 2016-03-08 |