RR

Rafael Reiter

IG Ims Nanofabrication Gmbh: 2 patents #2 of 4Top 50%
📍 Wien, AT: #34 of 312 inventorsTop 15%
Overall (2016): #106,363 of 481,213Top 25%
2
Patents 2016

Issued Patents 2016

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9495499 Compensation of dose inhomogeneity using overlapping exposure spots Elmar Platzgummer 2016-11-15
9269543 Compensation of defective beamlets in a charged-particle multi-beam exposure tool Elmar Platzgummer, Klaus Schiessel 2016-02-23