Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470712 | Apparatus and method for atomic force probing/SEM nano-probing/scanning probe microscopy and collimated ion milling | Matthew F. Stanton, Robert P. Marsin, Jochonia N. Nxumalo | 2016-10-18 |
| 9279849 | Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices | John Walsh | 2016-03-08 |