Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470712 | Apparatus and method for atomic force probing/SEM nano-probing/scanning probe microscopy and collimated ion milling | Terence L. Kane, Matthew F. Stanton, Jochonia N. Nxumalo | 2016-10-18 |